发明名称 |
Lithographic apparatus and device manufacturing method |
摘要 |
Optical system, especially an illumination objective for semiconductor lithography has a number of optical elements (2), at least one load bearing structure (3) that serves to deflect forces, including weight forces, away from the optical elements and a measurement structure (5) that is independent of the load bearing structure. The invention also relates to a corresponding method for changed the position of an object or an image in the inventive optical system, whereby the position of the optical elements is changed relative to the measurement structure, at least for known positions of the object and target positioning of the image in relation to the measurement structure. |
申请公布号 |
EP1278089(A3) |
申请公布日期 |
2004.02.04 |
申请号 |
EP20020254927 |
申请日期 |
2002.07.12 |
申请人 |
ASML NETHERLANDS B.V.;CARL ZEISS SEMICONDUCTOR MANUFACTURING TECHNOLOGIES AG |
发明人 |
LOOPSTRA, ERIK ROELOF;FRANKEN, DOMINICUS JACOBUS PETRUS ADRIANUS;SMITS, JOSEPHUS JACOBUS;VAN DIJSSELDONK, ANTONIUS JOHANNES JOSEPHUS;MOORS, JOHANNES HUBERTUS JOSEPHINA;HOF, ALBRECHT;MAUL, GUENTER;MUHLBEYER, MICHAEL;MEHLKOPP, KLAUS |
分类号 |
G02B7/182;G02B7/00;G02B7/02;G02B27/62;G03F7/20;G21K1/06;G21K5/02;H01L21/027 |
主分类号 |
G02B7/182 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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