发明名称 Lithographic apparatus and device manufacturing method
摘要 Optical system, especially an illumination objective for semiconductor lithography has a number of optical elements (2), at least one load bearing structure (3) that serves to deflect forces, including weight forces, away from the optical elements and a measurement structure (5) that is independent of the load bearing structure. The invention also relates to a corresponding method for changed the position of an object or an image in the inventive optical system, whereby the position of the optical elements is changed relative to the measurement structure, at least for known positions of the object and target positioning of the image in relation to the measurement structure.
申请公布号 EP1278089(A3) 申请公布日期 2004.02.04
申请号 EP20020254927 申请日期 2002.07.12
申请人 ASML NETHERLANDS B.V.;CARL ZEISS SEMICONDUCTOR MANUFACTURING TECHNOLOGIES AG 发明人 LOOPSTRA, ERIK ROELOF;FRANKEN, DOMINICUS JACOBUS PETRUS ADRIANUS;SMITS, JOSEPHUS JACOBUS;VAN DIJSSELDONK, ANTONIUS JOHANNES JOSEPHUS;MOORS, JOHANNES HUBERTUS JOSEPHINA;HOF, ALBRECHT;MAUL, GUENTER;MUHLBEYER, MICHAEL;MEHLKOPP, KLAUS
分类号 G02B7/182;G02B7/00;G02B7/02;G02B27/62;G03F7/20;G21K1/06;G21K5/02;H01L21/027 主分类号 G02B7/182
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