发明名称 Method of producing a capacitor electrode with a barrier structure
摘要 A capacitor electrode is produced with an underlying barrier structure. A barrier incorporation layer is used and a CMP (chemical mechanical polishing) process is employed in order to produce the barrier structure. The capacitor electrode with an underlying barrier structure is produced by depositing a barrier layer on a semiconductor substrate; forming a barrier structure from the barrier layer with a lithographic mask and an etching step; depositing a barrier incorporation layer covering the barrier structure and surrounding regions; and removing the barrier incorporation layer with chemical mechanical polishing until the barrier structure is uncovered, to thereby form the capacitor electrode above the barrier structure.
申请公布号 US6686265(B2) 申请公布日期 2004.02.03
申请号 US20020127618 申请日期 2002.04.22
申请人 INFINEON TECHNOLOGIES AG 发明人 BEITEL GERHARD;SAENGER ANNETTE;KASKO IGOR
分类号 H01L21/28;H01L21/02;H01L21/285;H01L21/3105;H01L21/321;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;(IPC1-7):H01L21/44 主分类号 H01L21/28
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