发明名称 CHIP TEST CONNECTOR
摘要 PURPOSE: A chip test connector is provided to make the chip test connector be in correct contact with devices to improve electrical connection state and enable accurate chip test. CONSTITUTION: A chip test connector includes an elastic housing(100), an upper contact part, a support, and a lower contact part. The elastic housing is made of rubber and has a hole(110) at each corner. The housing also has a plurality of accommodation parts(120) arranged at an equal distance. The upper contact part is formed of a conductive material and has external contacts(210) and inner contacts accommodated in the accommodation parts of the housing. The support is formed of a conductive material and connected with one side of the upper contact part to be accommodated in the accommodation part. The lower contact part is made of a conductive material and connected with the support. The end of the lower contact part is accommodated in the accommodation part and the center of the lower contact part is protruded from the bottom of the housing.
申请公布号 KR20040010495(A) 申请公布日期 2004.01.31
申请号 KR20030099972 申请日期 2003.12.30
申请人 LEENO IND.INC 发明人 LEE, CHAE YUN
分类号 H01R33/76;(IPC1-7):H01R33/76 主分类号 H01R33/76
代理机构 代理人
主权项
地址