发明名称 METHOD FOR FORMING CONTACT PAD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact pad of a semiconductor device is provided to be capable of achieving contact dimension and preventing losses of a hard mask. CONSTITUTION: A gate electrode structure(120) including a hard mask(115) is formed to define a contact pad formation region on a semiconductor substrate(100). The first interlayer dielectric(130) with voids between the gate contact structures is formed on the resultant structure. After expanding the voids on the contact pad formation region and removing the first interlayer dielectric on the gate electrode structure, the second interlayer dielectric is formed on the resultant structure. A contact hole(150) using the voids is then formed by polishing the second interlayer dielectric. A contact pad is formed by filling a conductive layer in the contact hole.
申请公布号 KR20040008650(A) 申请公布日期 2004.01.31
申请号 KR20020042318 申请日期 2002.07.19
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, HONG GIL;KIM, YEONG SEO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址