发明名称 |
METHOD FOR FABRICATING MOS TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a MOS transistor is provided to perform a transition process of a polysilicon gate electrode to a metal silicide gate electrode by increasing a contact area between the polysilicon gate electrode and a metal layer. CONSTITUTION: A semiconductor substrate(21) including a polysilicon electrode, a spacer(26), and a source/drain region(23) is provided. An insulating layer(29) is formed on the semiconductor substrate(21) including a polysilicon gate electrode. An upper surface of the polysilicon gate electrode is exposed by polishing the insulating layer(29). A side of the polysilicon gate electrode is exposed by etching the insulating layer and the spacer(26). A metal layer is formed thereon. A transition process of the polysilicon gate electrode to a metal silicide gate electrode(31) is performed by performing a thermal process.
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申请公布号 |
KR20040009750(A) |
申请公布日期 |
2004.01.31 |
申请号 |
KR20020043796 |
申请日期 |
2002.07.25 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
KIM, YEONG PIL |
分类号 |
H01L21/28;H01L21/302;H01L21/336;H01L21/461;H01L29/49;H01L29/76;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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