发明名称 |
COMPLEMENTARY METAL OXIDE SEMICONDUCTOR IMAGE SENSOR WITH DUAL MICRO LENS AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A complementary metal oxide semiconductor(CMOS) image sensor with a dual micro lens is provided to avoid a decrease of a detection characteristic at the edge of a pixel array and reduce a cross talk phenomenon between adjacent cells by reducing the effect of tilted light incident upon the edge of the pixel array. CONSTITUTION: Associated devices including photodiodes(22) are formed in a substrate(20). A passivation layer(25) is formed on the substrate. The first micro lens(28) is formed on the passivation layer. A nitride layer(29) is formed along the surface of the first micro lens. The passivation layer and the nitride layer are coated with an over-coating layer. The entire pixel array is covered with the second micro lens(31) formed on the over-coating layer.
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申请公布号 |
KR20040008924(A) |
申请公布日期 |
2004.01.31 |
申请号 |
KR20020042662 |
申请日期 |
2002.07.19 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LIM, YEON SEOP |
分类号 |
H01L27/146;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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