发明名称 FERROELECTRIC MEMORY DEVICE HAVING EXTENDED PLATE LINE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A ferroelectric memory device having an extended plate line and a fabricating method thereof are provided to increase a degree of integration by connecting one plate line to top electrodes of ferroelectric capacitors. CONSTITUTION: A ferroelectric memory device having an extended plate line includes a bottom interlayer dielectric(74), a plurality of ferroelectric capacitors(82), a plurality of oxygen barrier spacers(83a), a top interlayer dielectric(89,93), and a plurality of plate lines(97). The bottom interlayer dielectric(74) is formed on a semiconductor substrate(51). The ferroelectric capacitors(82) are arrayed in rows and columns on the bottom interlayer dielectric. The oxygen barrier spacers(83a) are arrayed on sidewalls of the ferroelectric capacitors. The top interlayer dielectric(89,93) is laminated on the entire surface of the semiconductor substrate(51). The plate lines(97) are arrayed within the top interlayer dielectric.
申请公布号 KR20040009865(A) 申请公布日期 2004.01.31
申请号 KR20020044224 申请日期 2002.07.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, GYU MAN;NAM, SANG DON;PARK, GEON SANG
分类号 H01L27/105;H01L21/768;H01L21/8246;H01L27/115;H01L29/76;(IPC1-7):H01L27/105 主分类号 H01L27/105
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