发明名称 CLEANING METHOD OF CHEMICAL VAPOR DEPOSITION CHAMBER
摘要 PURPOSE: A cleaning method of a CVD(Chemical Vapor Deposition) chamber is provided to be capable of improving cleaning efficiency and restraining by-product from being generated at the inner portion of the chamber. CONSTITUTION: A substrate is loaded at the inner portion of a chamber(S50). A titanium layer is deposited at the upper portion of the substrate(S52). The substrate is unloaded from the chamber(S54). The first plasma process is carried out at the inner portion of the chamber by using the first gas containing N and H(S56). A cleaning process is carried out at the inner portion of the chamber by in-situ(S58). The second plasma process is carried out at the inner portion of the chamber by using the second gas containing N and H(S60).
申请公布号 KR20040008873(A) 申请公布日期 2004.01.31
申请号 KR20020042598 申请日期 2002.07.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, GIL HYEON;KANG, SANG BEOM;MUN, GWANG JIN;PARK, HUI SUK
分类号 C23C16/44;(IPC1-7):H01L21/205 主分类号 C23C16/44
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