METHOD AND INSTRUMENT FOR MEASURING EMISSIVITY DISTRIBUTION

摘要

PURPOSE: To provide a method and instrument by which the emissivity distribution on the surface of a member to be measured can be measured accurately even when no light source is used. CONSTITUTION: The emissivity distribution measuring instrument 10 calculates the temperature Tij of the member 12 to be measured by pixels based on the ratio Rij between the radiant intensities detected at the same portion of the two images of the member 12 respectively obtained by using first and second wavelengths λ1 and λ2 selected out of the light emitted from the surface of the member 12 and the emissivity εij at every pixel based on the temperature distribution(the temperature Tij by pixel) from a predetermined relation. Therefore, the emissivity distribution on the surface of the member 12 can be measured accurately from the radiant intensity εij at every pixel even when no light source is used.