发明名称 RESIST PEELING APPARATUS
摘要 PURPOSE: To provide a resist peeling apparatus capable of preventing a variance in concentration of an effective component contained in a resist peeling solution, reducing the amount of the solution used and reducing the amount of waste gas to be treated. CONSTITUTION: The resist peeling apparatus 100 has a rinsing system 2 with a rinsing chamber 21, which is provided on a resist peeling system 1 with a plurality of resist stripping chambers 11 arranged in succession. The resist peeling chambers 11 are purged with gaseous nitrogen from a gaseous nitrogen supply system 7. A gaseous mixture containing a component of an aqueous resist peeling solution R1 generated in the chambers 11 is sent to a liquid recovery-supply system 3 and subjected to gas-liquid separation. A recovered resist peeling solution R2 is returned to a peeling solution tank 13 and a separated gas G is used for dewatering a substrate W supplied to each gas knife 12 in the chambers 11.
申请公布号 KR20040010252(A) 申请公布日期 2004.01.31
申请号 KR20030049225 申请日期 2003.07.18
申请人 HIRAMA LABORATORIES CO., LTD.;NAGASE & CO., LTD.;NAGASE CMS TECHNOLOGY CO., LTD. 发明人 NAKAGAWA TOSHIMOTO;OGAWA SHU;MORITA SATORU;KOBAYAKAWA YASUYUKI;KIKUKAWA MAKOTO
分类号 G03F7/42;H01L21/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/42
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