发明名称 |
SEMICONDUCTOR EQUIPMENT AND DIAGNOSIS EQUIPMENT THEREFOR, AND OPERATING SYSTEM OF THE SEMICONDUCTOR EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide semiconductor equipment where a user can determine conditions of the equipment or causes of malfunction accurately in a short time. SOLUTION: The semiconductor equipment has a main body that processes materials to form the semiconductor; recording means that record operation data of the main body as predetermined data; and display means that are located at a remote point from the main body, and displays simulated results of arithmetic means that compute and simulate the operation of the main body using the data. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004031381(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20020180740 |
申请日期 |
2002.06.21 |
申请人 |
HITACHI HIGH TECH CORP |
发明人 |
NAKAMOTO SHIGERU;KONDO HIDEAKI;ARIMA JUNTARO |
分类号 |
H01L21/02;(IPC1-7):H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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