发明名称 Diode fault detection system and method
摘要 Disclosed are a system and method of detecting a diode fault among diodes coupled to a plurality of redundant power feeds. A diode short fault may be detected by measuring a first voltage across a first one of the diodes, measuring a second voltage between two nodes including a terminal of the first diode and detecting the diode short based upon the first and second voltages. A diode open fault may be detected by decoupling a first one of the diodes from a power feed and measuring the voltage across the diode.
申请公布号 US2004017642(A1) 申请公布日期 2004.01.29
申请号 US20020205140 申请日期 2002.07.24
申请人 ALAPPAT KURIAPPAN P. 发明人 ALAPPAT KURIAPPAN P.
分类号 H02H3/04;H02H7/26;H02J1/10;(IPC1-7):H02H7/00 主分类号 H02H3/04
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