发明名称 X-RAY FOREIGN MATTER DETECTION DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To grasp at a glance inclination or dispersion in each kind of inspection objects, and to adjust easily to a proper detection limit value. <P>SOLUTION: In this X-ray foreign matter detection device, the inspection object W is exposed to X-rays, and existence of a foreign matter in the inspection object is inspected based on the transmission quantity of the X-rays transmitted through the inspection object following the X-ray exposure, and the inspection result is displayed on a display screen of a display 5. In the device, data for showing a product influence caused by one of the maximum value or the mean value of X-ray transmission data of each inspected inspection object, a product area and a product volume is trend-displayed in the order of oldness of inspections together with the inspection progress of the inspection object on a displat screen of the display 5. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004028685(A) 申请公布日期 2004.01.29
申请号 JP20020183118 申请日期 2002.06.24
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 SEKI TAKAYUKI;SUZUKI TAKASHI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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