| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To judge a product influence multilaterally, and to set easily the optimum detection limit value. <P>SOLUTION: In this X-ray foreign matter detection device, the inspection object is exposed to X-rays, and existence of a foreign matter in the inspection object is inspected based on the transmission quantity of the X-rays transmitted through the inspection object following the X-ray exposure, and the inspection result is displayed on a display screen 5a of a display 5. When displaying the inspection result, a sectional waveform image in the direction roughly orthogonal to the conveyance direction of the inspection object at the X-ray exposure time and a three-dimensional birds'-eye waveform image of the inspection object at the X-ray exposure time are selectively displayed on the display screen 5a of the display 5 in addition to the inspection result of the inspection object and a two-dimensional plane waveform image at the X-ray exposure time corresponding to the transmission quantity of the X-rays at the X-ray exposure time to the inspection object. <P>COPYRIGHT: (C)2004,JPO</p> |
