发明名称 |
NONVOLATILE SEMICONDUCTOR STORAGE DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To form an electrically erasable memory cell with a MOS transistor having a single gate electrode instead of a laminated structure. <P>SOLUTION: The nonvolatile semiconductor storage device is provided with a selection transistor 11 formed of a MOS transistor having a gate electrode; a bit line BL connected with a drain area of the selection transistor 11; a word line WL connected with the gate electrode of the selection transistor 11; a cell transistor 12 which is provided with a gate electrode that is not connected with both and is in potentially floating state, and of which drain area is connected with a source area of the selection transistor 11, and which is formed of a MOS transistor with the same polarity as the selection transistor 11; and a source line SL connected with a source area of the cell transistor 12. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2004031920(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20030100506 |
申请日期 |
2003.04.03 |
申请人 |
TOSHIBA CORP |
发明人 |
SHIRATA RIICHIRO;SUGIMAE KIKUKO |
分类号 |
G11C16/04;G11C16/02;G11C16/06;H01L21/8234;H01L21/8247;H01L27/06;H01L27/088;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;H01L31/109;(IPC1-7):H01L21/824;H01L21/823 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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