发明名称 FEEDER FOR POLYHEDRON INSPECTION, AND POLYHEDRON INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a feeder for polyhedron inspection and a polyhedron inspection device that can ensure reliability of inspection accuracy by reliably moving objects to be inspected one by one. SOLUTION: The polyhedron inspection device comprises supplying means 11 for supplying chips W consisting of a chip capacitor and the like as objects to be inspected, moving means 12 annexed to the supplying means 11, and the polyhedron inspection feeder 13. The polyhedron inspection feeder 13 includes a rotary feed part 41 having a groove 50 for rotating the chips W substantially over 180 degrees while moving the chips W. The moving means 12 comprise a belt B, and receive and move the chips W one by one in punched holes 38 formed in the surface of the belt B to move the chips W one by one. In the region of the polyhedron inspection feeder 13, four cameras 14 to 17 image inspection surfaces of the chips W to detect surface accuracy. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004026453(A) 申请公布日期 2004.01.29
申请号 JP20020187661 申请日期 2002.06.27
申请人 LINTEC CORP 发明人 KIKAWA KAZUHIRO
分类号 B07C5/02;B65G47/22;B65G47/248;G01B5/00;G01B11/24;G01B11/30;H01L;(IPC1-7):B65G47/248 主分类号 B07C5/02
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