发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, INTEGRATED CIRCUIT USING THE SAME, ELECTRO-OPTICAL DEVICE AND ELECTRONIC UNIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a thin film semiconductor device in which a semiconductor film formed on a substrate is used as an active region of the semiconductor device and crystallinity of the semiconductor film and an electric characteristic of the device are good and reliability of a gate insulating film is high. SOLUTION: A base protection film 112 is formed on a quartz substrate 111 and the semiconductor film 113 is formed. The semiconductor film 113 is melted and crystallized by irradiation with light. The semiconductor film 113 is thermally oxidized and a first gate insulating film 116 is formed. A second gate insulating film 117 is deposited by a CVD method. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004031459(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20020182156 |
申请日期 |
2002.06.21 |
申请人 |
SEIKO EPSON CORP |
发明人 |
JIROKU HIROAKI |
分类号 |
H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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