发明名称 SURFACE CHARACTERISTICS MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a surface characteristics measuring apparatus for extremely easily relating a point on a graph of test force-cartridge output to a location in a sample surface after test. SOLUTION: The graph G for the test force vs. cartridge output is displayed with an image P of the sample surface after test by a camera 9 on a display 12. By specifying any point on the graph G, a stage drive mechanism 7 is automatically controlled in such a way that the location in the sample surface corresponding to the specified point is located at a specific location such as the center of the image. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004028949(A) 申请公布日期 2004.01.29
申请号 JP20020189403 申请日期 2002.06.28
申请人 SHIMADZU CORP 发明人 KAMISAKA TAKESHI
分类号 G01L5/00;G01N3/00;G01N19/04;(IPC1-7):G01N19/04 主分类号 G01L5/00
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