发明名称 |
Process and assembly for non-destructive surface inspection |
摘要 |
An optical system for detecting defects on a wafer that includes a device for producing a beam and directing the beam onto the wafer surface, producing an illuminated spot on the wafer's surface. The system further includes a detector detecting light, and a mirrored assembly having together with the detector an axis of symmetry about a line perpendicular to the wafer surface. The assembly is configured to receive scattered light from the surface, where the scattered light including a first scattered light part being scattered from the pattern. The assembly is further configured to reflect and focus rotationally symmetrically about the axis of symmetry the scattered light to the detector. The system further includes a device operating with the detector for facilitating detection of a scattered light other than the specified scattered light due to pattern.
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申请公布号 |
US2004016896(A1) |
申请公布日期 |
2004.01.29 |
申请号 |
US20020208113 |
申请日期 |
2002.07.29 |
申请人 |
APPLIED MATERIALS ISRAEL, INC. |
发明人 |
ALMOGY GILAD;NAFTALI RON;GUETTA AVISHAY;SHOHAM DORON |
分类号 |
G01N21/95;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/95 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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