| 摘要 |
Embodiments of an apparatus and method for cleaning the probes of a probe device are disclosed. In an illustrated embodiment, a cleaning apparatus comprises a cleaning member having a cleaning surface and a support member for supporting the cleaning member. An adjustment mechanism is operable to adjust the tilt orientation of the cleaning surface relative to the probe tips to maximize contact between the probe tips and the cleaning surface when the probe tips are rubbed against the cleaning surface to remove debris therefrom. In particular embodiments, the adjustment mechanism comprises one or more adjusting screws and one or more corresponding hold-down screws extending generally co-axially through the adjusting screws. |
