发明名称 METHOD FOR VISUAL INSPECTION OF MICROCOMPONENT, APPARATUS AND PROGRAM THEREFOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for visual inspection of microcomponents, which is capable of quickly performing an accurate full visual inspection processing by properly correcting errors due to the turbulence of an attitude with one-time imaging, and to provide an apparatus and program therefor. <P>SOLUTION: Six surfaces (A to F surfaces) are imaged at the same time at the point when a square chip 9 passes in an inspection part 33, and the values of LAm to LDm, RAm to RDm, LEFm, &theta;A, &theta;B, &theta;Fm, HAm, WBm are measured. Corrections by tilts of irradiation mirrors 39a, 39b are made from the &theta;Fm to obtain &theta;F, and a height h and width w are computed on the basis of the values of the &theta;F, HAm, WBm. Then, the values of the LAm to LDm, RAm to RDm, LEFm are corrected by the principle of trigonometric functions on the basis of the values of the h, w, &theta;A, &theta;B, and the values of La to Ld, Ra to Rd, Lef are computed. Consequently, by considering the turbulence of the attitude on the whole, that is, a tilt to an axis line along with the traveling direction of the square chip 9 and rotation around the axis line, true dimensions can be accurately estimated. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004028757(A) 申请公布日期 2004.01.29
申请号 JP20020184530 申请日期 2002.06.25
申请人 YAMAHA FINE TECHNOLOGIES CO LTD 发明人 ITO TAKESHI;SASAMINE KEIICHIRO;HARA TAKUYA
分类号 G01B11/02;G01B11/04;G01N21/85;G06T1/00 主分类号 G01B11/02
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