发明名称 Semiconductor device with insulator and manufacturing method therefor
摘要 It is possible to obtain a semiconductor device with an element isolation structure showing a good isolation characteristic by filing an interior of a minute trench with a good quality insulating film free of a defect such as a void, and a manufacturing method therefor. The semiconductor device includes a semiconductor substrate and an isolation insulator. A trench is formed on a main surface of the semiconductor substrate. The isolation insulator is formed in an interior of the trench using a thermal oxidation method to isolate element forming regions from each other on the main surface of the semiconductor substrate. The isolation insulator is a lamination body formed by a plurality of oxide film layers.
申请公布号 US2004016987(A1) 申请公布日期 2004.01.29
申请号 US20030335943 申请日期 2003.01.03
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SAWADA MAHITO;TOBIMATSU HIROSHI;HAYASHIDE YOSHIO
分类号 H01L21/76;H01L21/205;H01L21/316;H01L21/762;H01L21/8234;(IPC1-7):H01L21/76;H01L29/00 主分类号 H01L21/76
代理机构 代理人
主权项
地址