发明名称 |
METHOD AND DEVICE FOR SILICON BASE THIN FILM FORMATION, AND SEMICONDUCTOR ELEMENT |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a silicon base thin film formation device which can form a silicon base thin film which has high quality and excellent uniformity. <P>SOLUTION: In the device, a plurality of silicon base thin films are formed on a substrate by using a plurality of deposition film formation containers. A high frequency power of a first frequency chosen from 30MHz or more and 500MHz or less is applied to a power impressing electrode inside a deposition film formation container which is arranged so that the clearance between a power impressing electrode and the substrate 204 is 10mm±5mm. A high frequency power of a second frequency chosen from 10MHz or more and 30MHz or less is applied to a power impressing electrode inside a deposition film formation container which is arranged so that the clearance between the power impressing electrode and the substrate 204 is 20mm±5mm. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2004031371(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20020168554 |
申请日期 |
2002.06.10 |
申请人 |
CANON INC |
发明人 |
KONDO TAKAHARU;MATSUDA KOICHI;SAKAI AKIRA |
分类号 |
C23C16/509;H01L21/205;H01L31/04;H01L31/20;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/509 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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