| 摘要 |
PROBLEM TO BE SOLVED: To provide an aspheric surface eccentricity measuring device and an aspheric surface eccentricity measuring method for measuring highly accurately the aspheric surface eccentricity and the aspheric surface eccentricity direction of an aspherical lens, even if shape errors exist in the aspherical lens. SOLUTION: A rotation part 4 rotates the lens 1 held by a holding part 3. A spot locus detection means 5 detects a spot locus of light reflected by the lens 1. An annular region shape data acquisition means 6 acquires shape data of an annular region on a test surface 1b of the lens 1. A processing part 8 compares the shape data of the annular region with inputted shape data of the test surface 1b, and acquires the position of the surface top 1tb of the test surface 1b. The processing part 8 acquires the eccentricity quantity and the eccentricity direction of paraxial curvature centers 1oa, 1ob of the test surfaces 1a, 1b from the spot locus. The processing part 8 acquires the aspherical surface eccentricity quantity and the aspherical surface eccentricity direction of the test surface 1b from the position of the surface top 1tb and the eccentricity quantity and the eccentricity direction of paraxial curvature centers 1oa, 1ob. COPYRIGHT: (C)2004,JPO
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