发明名称 |
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD |
摘要 |
<p>An X-ray inspection device comprises an X-ray generator (1), a monochromator (2) which receives X-ray from the X-ray generator (1), adjusts its energy density, and emits the X-ray of the predetermined wavelength with a predetermined width, a collimator (3) which receives the X-ray from the monochromator (2) and emits the X-ray in the predetermined direction, an analyzer (4) which inputs the X-ray which is emitted from the collimator (3) and refracted when passing through a work to be inspected, and intensifies the degree of refraction, an X-ray sensor (5) which inputs the X-ray emitted from the analyzer (4) and sensor its intensity, and an image display device (6) which displays the image showing the internal state of the work (A) based on the intensity sensed by the X-ray sensor (5).</p> |
申请公布号 |
WO2004010125(A1) |
申请公布日期 |
2004.01.29 |
申请号 |
WO2002JP07336 |
申请日期 |
2002.07.18 |
申请人 |
HITACHI ZOSEN CORPORATION;SUGIMOTO, IWAO;KOMURA, AKIO;ANDO, MASAMI |
发明人 |
SUGIMOTO, IWAO;KOMURA, AKIO;ANDO, MASAMI |
分类号 |
G01N23/04;(IPC1-7):G01N23/04;A61B6/03 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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