发明名称 |
X-RAY FOREIGN MATTER DETECTION METHOD AND X-RAY FOREIGN MATTER DETECTION SYSTEM |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To individually materialize foreign matter detection at high sensitivity concerning a plurality of kinds of objects to be inspected in a package. <P>SOLUTION: An X-ray foreign matter detection method comprises an X-ray exposure process for exposing an X-ray on the package P divided into a plurality of storing regions A-D and the plurality of the kinds of the objects to be inspected Wa-Wd stored to each storing region A-D respectively; a process for outputting X-ray intensity data corresponding to a transmission dose of the X-ray transmitting the package P and each object to be inspected Wa-Wd; a process for generating X-ray images Ip and Iwa-Iwd of the package P and each object to be inspected Wa-Wd; a process for designating the regions in each X-ray image IA-ID and Iwa-Iwd; a process for setting a foreign matter detection threshold value T in each X-ray image IA-ID (Iwa-Iwd) designating the regions; and a process for carrying out foreign matter determination on the basis of the X-ray image and the foreign matter detection threshold value in each storing region. <P>COPYRIGHT: (C)2004,JPO</p> |
申请公布号 |
JP2004028768(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20020184754 |
申请日期 |
2002.06.25 |
申请人 |
ANRITSU SANKI SYSTEM CO LTD |
发明人 |
SEKI TAKAYUKI;YAGI MASAHIRO;KAWAHARA HIROKI |
分类号 |
G01N23/04;G01V5/00;(IPC1-7):G01V5/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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