发明名称 DEVICE FOR EVALUATING SOUNDNESS OF STRUCTURE AND METHOD FOR EVALUATING SOUNDNESS OF STRUCTURE USING THE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a device for evaluating the soundness of a structure which performs quantitative evaluation of a minute damage about the structure and a method for evaluating the soundness of the structure using the device. SOLUTION: In this method for evaluating the soundness of the structure which evaluates the damage of the structure by continuously observing the change in electric impedance generated in a piezoelectric element 20 which is attached on the structure 10 while generating a high frequency elastic wave in the structure 10 by applying a voltage to the piezoelectric element 20, the electric impedance is continuously observed by using the damage evaluating index of peak frequency shift quantityΔF, peak amplitude ratio change rateδand Q value ratio change rateγ. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004028907(A) 申请公布日期 2004.01.29
申请号 JP20020188586 申请日期 2002.06.27
申请人 KO SHIYOUI;NISSHIN KOGYO KK 发明人 KO SHIYOUI;HIRONAKA YOSHIMITSU;NAKAMITSU MASASHI
分类号 G01N29/09;G01M7/02;G01N27/02;(IPC1-7):G01M7/02;G01N29/16 主分类号 G01N29/09
代理机构 代理人
主权项
地址