发明名称 |
DEVICE FOR EVALUATING SOUNDNESS OF STRUCTURE AND METHOD FOR EVALUATING SOUNDNESS OF STRUCTURE USING THE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a device for evaluating the soundness of a structure which performs quantitative evaluation of a minute damage about the structure and a method for evaluating the soundness of the structure using the device. SOLUTION: In this method for evaluating the soundness of the structure which evaluates the damage of the structure by continuously observing the change in electric impedance generated in a piezoelectric element 20 which is attached on the structure 10 while generating a high frequency elastic wave in the structure 10 by applying a voltage to the piezoelectric element 20, the electric impedance is continuously observed by using the damage evaluating index of peak frequency shift quantityΔF, peak amplitude ratio change rateδand Q value ratio change rateγ. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004028907(A) |
申请公布日期 |
2004.01.29 |
申请号 |
JP20020188586 |
申请日期 |
2002.06.27 |
申请人 |
KO SHIYOUI;NISSHIN KOGYO KK |
发明人 |
KO SHIYOUI;HIRONAKA YOSHIMITSU;NAKAMITSU MASASHI |
分类号 |
G01N29/09;G01M7/02;G01N27/02;(IPC1-7):G01M7/02;G01N29/16 |
主分类号 |
G01N29/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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