发明名称 Bi-metallic test switch
摘要 A convoluted, bi-metallic test strip is inserted between a battery and an electrical circuit within a flashlight having a nonzero, quiescent, current drain. Squeezing the test strip permits consumers to temporarily test the flashlight. The strip is then removed by consumers after the flashlight has been purchased.
申请公布号 US2004018418(A1) 申请公布日期 2004.01.29
申请号 US20020206465 申请日期 2002.07.26
申请人 ALLEN DAVID M. 发明人 ALLEN DAVID M.
分类号 G01R31/36;F21V23/04;G01N27/416;G01R31/00;G01R31/44;H01H;H01H13/70;H01H27/04;H01M6/50;H01M10/48;(IPC1-7):H01M10/48 主分类号 G01R31/36
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