发明名称 Mechanical deformation amount sensor
摘要 A mechanical deformation amount sensor includes a sensor structure (1) which is formed by a semiconductor substrate or an insulating substrate and integrally includes a deformation portion (2) deformable, when a physical quantity to be detected is applied to the sensor structure (1), due to the physical quantity and a support portion (1a) for supporting the deformation portion (2), a carbon nanotube resistance element (61, 62) which is provided on the deformation portion (2) so as to be mechanically deformed in response to deformation of the deformation portion (2) and a wiring pattern (7) which is formed in a pattern on the sensor structure (1) so as to be connected to the carbon nanotube resistance element (61, 62). By applying a voltage to the carbon nanotube resistance element (61, 62) via the wiring pattern (7), a change of electrical conductivity of the carbon nanotube resistance element (61, 62) upon mechanical deformation of the carbon nanotube resistance element (61, 62) is fetched as an electrical signal.
申请公布号 EP1384612(A2) 申请公布日期 2004.01.28
申请号 EP20030012387 申请日期 2003.05.30
申请人 MATSUSHITA ELECTRIC WORKS, LTD. 发明人 MIYAJIMA, HISAKAZU;ARAKAWA, MASAO;YABUTA, AKIRA;SAKAI, JUN
分类号 G01L9/00;B60J7/057;B81B3/00;B82B1/00;G01P15/12;H01L29/84 主分类号 G01L9/00
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