发明名称 |
BIT LINE SENSE AMPLIFIER CIRCUIT SHARED BY FIRST MEMORY BLOCK AND SECOND MEMORY BLOCK IN SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A bit line sense amplifier circuit shared by the first memory block and the second memory block in a semiconductor memory device is provided to perform a wafer burn-in mode. CONSTITUTION: According to the sense amplifier circuit shared by the first memory block and the second memory block in a semiconductor memory device, an amplification part(502) senses a voltage difference between the first node and the second node and then amplifies it. The first connection part(504) connects a bit line and a corresponding bit bar line of the first memory block to the first node and the second node selectively. The second connection part(506) connects a bit line and a corresponding bit bar line of the second memory block to the first node and the second node selectively. And a bit line precharge part(508) applies the first bit line precharge voltage to the first node and the second bit line precharge voltage to the second node, in a wafer burn-in mode.
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申请公布号 |
KR20040007947(A) |
申请公布日期 |
2004.01.28 |
申请号 |
KR20020041229 |
申请日期 |
2002.07.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SEONG RYONG;LEE, SANG GWON |
分类号 |
G11C7/06;(IPC1-7):G11C7/06 |
主分类号 |
G11C7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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