发明名称 Resist composition and method for manufacturing semiconductor device using the resist composition
摘要 <p>A resist composition comprises: at least one type of a first compound having two or more intramolecular adamantyl structures represented by the chemical formula 1 below; a base resin; and a second compound which generates an acid by active beam irradiation. &lt;CHEM&gt; wherein X is -(OCO)m-(CH2)n-(COO)m-, where m = 0 or 1 and n = 0, 1, 2 or 3 provided when n = 0, m = 0; and Y and Z are H, OH, F, Cl, Br, R or COOR, where Y may be Z, or Y and Z may be introduced in a single adamantyl structure and R represents a straight or branched alkyl group having 1 to 8 carbon atoms. &lt;IMAGE&gt;</p>
申请公布号 EP1179749(B8) 申请公布日期 2004.01.28
申请号 EP20010118916 申请日期 2001.08.03
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC.;IDEMITSU PETROCHEMICAL CO., LTD. 发明人 TORIUMI, MINORU;SATOU, ISAO;WATANABE, HIROYUKI;KATAI, SHUNJI;SUZUKI, SHINTARO
分类号 G03F7/028;C07C35/37;C07C69/96;C08K5/02;C08K5/09;C08K5/10;C08K5/17;C08K5/41;C08L33/02;C08L33/06;C08L101/00;G03F7/004;G03F7/038;G03F7/039;H01L21/027;(IPC1-7):G03F7/004 主分类号 G03F7/028
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