Fabrication facility cycle time approximation method employing historic work in process (WIP) cycle time correlation

摘要

Within a method for approximating a cycle time for fabricating a microelectronic fabrication within a microelectronic fabrication facility there is first determined from historic data for fabrication of the microelectronic fabrication within the microelectronic fabrication facility a constant which correlates previous microelectronic fabrication loadings and cycle times within the microelectronic fabrication facility. The correlating constant may then be employed for approximating a cycle time for a future work in process (WIP) quantity of the microelectronic fabrication within the microelectronic fabrication facility.