发明名称 Semiconductor device and method and apparatus for fabricating the same
摘要 The semiconductor device of the present invention includes: a substrate; a first conductor film supported by the substrate; an insulating film formed on the substrate to cover the first conductor film, an opening being formed in the insulating film; and a second conductor film, which is formed within the opening of the insulating film and is in electrical contact with the first conductor film. The second conductor film includes: a silicon-containing titanium nitride layer formed within the opening of the insulating film; and a metal layer formed over the silicon-containing titanium nitride layer. The metal layer is mainly composed of copper.
申请公布号 US6683381(B2) 申请公布日期 2004.01.27
申请号 US20010884135 申请日期 2001.06.20
申请人 MATSUSHITA ELECTRIC INDUSTRSIAL CO., LTD. 发明人 HARADA TAKESHI
分类号 H01L21/768;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/768
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