发明名称 Method for controlling a temperature of a polishing pad used in planarizing substrates
摘要 A method for controlling a polishing characteristic of a polishing pad used in the planarization of a substrate is disclosed. The method includes controlling the temperature of a planarizing surface of the polishing pad so that waste matter accumulations on the planarizing surface are softened and/or be come soluble. The planarizing surface is heated by directing a flow of heated planarizing liquid or a heated gas onto the surface so that the material comprising the planarization surface attains approximately its glass transition temperature. Alternatively, the planarizing surface may be heated by heating a support surface beneath the polishing pad or by heating the air proximate to the polishing pad.
申请公布号 US6682404(B2) 申请公布日期 2004.01.27
申请号 US20010853740 申请日期 2001.05.10
申请人 MICRON TECHNOLOGY, INC. 发明人 BRUNELLI THAD LEE
分类号 B24B37/04;B24B49/14;B24B53/007;B24B53/013;H01L21/306;(IPC1-7):B24B1/00;B24B49/00;B24B21/28 主分类号 B24B37/04
代理机构 代理人
主权项
地址