发明名称 |
Apparatus for and method of measuring capacitance with high accuracy |
摘要 |
For measuring a capacitance with high accuracy, a capacitance measuring apparatus includes a voltage source with a current limiting function for applying different voltage values to the capacitance, and an integrator capable of continuous integrating operation for repeatedly integrating a current flowing through the capacitance at given periodic intervals. There is also disclosed a capacitance measuring method that is carried out by the capacitance measuring apparatus.
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申请公布号 |
US6683462(B2) |
申请公布日期 |
2004.01.27 |
申请号 |
US20010004333 |
申请日期 |
2001.11.02 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
SHIMIZU AKIRA |
分类号 |
G01R27/26;G01R31/26;(IPC1-7):G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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