发明名称 |
METHOD AND APPARATUS FOR PERFORMING LOCALIZED THERMAL ANALYSIS AND SUB-SURFACE IMAGING BY SCANNING THERMAL MICROSCOPY |
摘要 |
A platinum/rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few .mu.m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
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申请公布号 |
CA2225315(C) |
申请公布日期 |
2004.01.27 |
申请号 |
CA19972225315 |
申请日期 |
1997.04.22 |
申请人 |
TA INSTRUMENTS, INC. |
发明人 |
HAMMICHE, AZZEDINE;POLLOCK, HUBERT MURRAY MONTAGU;SONG, MO;READING, MICHAEL |
分类号 |
G01N25/20;G01N13/10;G01N25/48;(IPC1-7):G01N25/20;G01N25/00;G01B15/04 |
主分类号 |
G01N25/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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