发明名称 INTEGRATION OF TWO MEMORY TYPES
摘要 Both a non-volatile memory (NVM) and a dynamic nanocrystal memory (DNM) are integrated on a semiconductor substrate. Control gates and control dielectrics with embedded nanocrystals or discrete storage elements are formed over differing thicknesses of tunnel dielectrics to form the two memories. Source and drain regions are formed within the semiconductor substrate adjacent to the tunnel dielectrics. Various methods can be used to form a thin tunnel oxide and a thick tunnel oxide by adding minimum processing steps.
申请公布号 KR20040007728(A) 申请公布日期 2004.01.24
申请号 KR20037016432 申请日期 2003.12.15
申请人 发明人
分类号 H01L27/10;H01L27/115;H01L21/28;H01L21/8242;H01L21/8247;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L27/10
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