发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to improve the electric field and increase a refresh period by increasing the thickness of a gate spacer of a sidewall of a gate electrode. CONSTITUTION: A gate electrode is formed on an upper surface of a semiconductor substrate. A cell junction region is formed on the semiconductor substrate of both sides of the gate electrode by performing an ion implantation process, using the energy of 15 to 60keV. A gate spacer having the thickness of 300 to 600 angstrom is formed on a sidewall of the gate electrode. A cell plug implant region is formed on the cell junction region by performing the ion implantation process using the energy of 15 to 100keV. A contact plug(600) is formed to be electrically connected to the cell junction region.
申请公布号 KR20040006069(A) 申请公布日期 2004.01.24
申请号 KR20020039584 申请日期 2002.07.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG, BYEONG SEOP;OH, JAE GEUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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