发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to improve the electric field and increase a refresh period by increasing the thickness of a gate spacer of a sidewall of a gate electrode. CONSTITUTION: A gate electrode is formed on an upper surface of a semiconductor substrate. A cell junction region is formed on the semiconductor substrate of both sides of the gate electrode by performing an ion implantation process, using the energy of 15 to 60keV. A gate spacer having the thickness of 300 to 600 angstrom is formed on a sidewall of the gate electrode. A cell plug implant region is formed on the cell junction region by performing the ion implantation process using the energy of 15 to 100keV. A contact plug(600) is formed to be electrically connected to the cell junction region.
|
申请公布号 |
KR20040006069(A) |
申请公布日期 |
2004.01.24 |
申请号 |
KR20020039584 |
申请日期 |
2002.07.09 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HONG, BYEONG SEOP;OH, JAE GEUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|