发明名称 |
METHOD FOR FORMING METAL LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a metal layer of a semiconductor device is provided to improve a burying characteristic of a fine contact hole and prevent the loss of a reaction chamber by performing a deposition process under the present air pressure without using a high vacuum chamber. CONSTITUTION: A liquefied titanium compound(5) is coated on an upper surface of a wafer(1). A solvent is removed from the liquefied titanium compound(5) by hardening the liquefied titanium compound on the upper surface of the wafer(1). A titanium metal layer is deposited thereon. The liquefied titanium compound(5) has a structure of H2TiO5. The liquefied titanium compound is deposited by using a spin coating method. In the spin coating method, the rotation speed is 500 to 1000 RPM(Revolution Per Minute).
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申请公布号 |
KR20040006775(A) |
申请公布日期 |
2004.01.24 |
申请号 |
KR20020041163 |
申请日期 |
2002.07.15 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HUI JUN;KIM, U HYEON |
分类号 |
H01L21/208;(IPC1-7):H01L21/208 |
主分类号 |
H01L21/208 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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