发明名称 METHOD FOR FORMING METAL LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a metal layer of a semiconductor device is provided to improve a burying characteristic of a fine contact hole and prevent the loss of a reaction chamber by performing a deposition process under the present air pressure without using a high vacuum chamber. CONSTITUTION: A liquefied titanium compound(5) is coated on an upper surface of a wafer(1). A solvent is removed from the liquefied titanium compound(5) by hardening the liquefied titanium compound on the upper surface of the wafer(1). A titanium metal layer is deposited thereon. The liquefied titanium compound(5) has a structure of H2TiO5. The liquefied titanium compound is deposited by using a spin coating method. In the spin coating method, the rotation speed is 500 to 1000 RPM(Revolution Per Minute).
申请公布号 KR20040006775(A) 申请公布日期 2004.01.24
申请号 KR20020041163 申请日期 2002.07.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HUI JUN;KIM, U HYEON
分类号 H01L21/208;(IPC1-7):H01L21/208 主分类号 H01L21/208
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