| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit incorporated with a self-test function, capable of performing a self-test on a peripheral function block and reducing test costs. <P>SOLUTION: This system comprises an input/output port connected with a pad 1 and constituted of a port direction register 3, a port register 4 and a comparator 5, and the peripheral function block 6 connected with the pad 1. When output of the peripheral function block 6 is desired to be tested, an expected value for the output of the peripheral function block 6 is set to the port register 4, and a value for making the input/output port an input port is set to the port direction register 3, then the value output from the peripheral function block 6 and passed through the pad 1 and the expected value set to the port register 4 are compared by the comparator 5 for determining the test. <P>COPYRIGHT: (C)2004,JPO |
