发明名称 X-ray measuring apparatus
摘要 The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and high sensitivity, which includes: an x-ray source for emitting x-rays from an x-ray focal spot; an x-ray detector in which a plurality of sensing elements each having a sensitive part and a blind part surrounding the sensitive part are arranged two-dimensionally; data processing means for collecting output signals of the sensing elements and performing data processing; and an anti-scatter grid disposed between the x-ray focal spot and the x-ray detector with predetermined distance from the position of the x-ray focal spot and in which an x-ray transmitting member and an x-ray shielding member are alternately arranged in a first direction. A pitch in the first direction of linear images projected on a sensing surface of the x-ray detector of the x-ray shielding member by the x-ray is set to be substantially an integral multiple of two or larger of the pitch of arrangement of the sensing elements in the first direction. In such a manner, a moiré-free image of a wide field of view is obtained.
申请公布号 US2004013224(A1) 申请公布日期 2004.01.22
申请号 US20020296511 申请日期 2002.11.26
申请人 BABA RIKA;UEDA KEN 发明人 BABA RIKA;UEDA KEN
分类号 G01N23/04;G01T1/00;G01T7/00;G21K1/02;(IPC1-7):G21K1/12 主分类号 G01N23/04
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