发明名称 |
System and method for chemical analysis using laser ablation |
摘要 |
A system and method for chemically analyzing single particles in a high velocity gas flow. The system comprises an ion source chamber having a gas inlet and outlet, and a high-energy, pulsed, ultraviolet laser for ablating the single particles in the high velocity gas flow entering the ion source chamber through the gas inlet to produce positively- and negatively-charged ions. The system further includes a first extraction plate for extracting the positively-charged ions provided in the ion source chamber, and a second extraction plate for extracting the negatively-charged ions provided in the ion source chamber. The positively-charged ions are injected into a first ion mobility spectrometer where they are detected and characterized. The negatively-charged ions are injected into a second ion mobility spectrometer where they are detected and characterized. The dual ion mobility spectrometers configuration of the present invention permits characterization of both the positively- and negatively-charged ions from a single gas particle.
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申请公布号 |
US2004011952(A1) |
申请公布日期 |
2004.01.22 |
申请号 |
US20030297648 |
申请日期 |
2003.07.03 |
申请人 |
JOHNSTON MURRAY V.;LAKE DEREK A.;EICEMAN GARY A. |
发明人 |
JOHNSTON MURRAY V.;LAKE DEREK A.;EICEMAN GARY A. |
分类号 |
B01D59/44;G01N27/64;H01J49/04;H01J49/10;H01J49/16;H01J49/40;(IPC1-7):H01J49/40 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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