| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical axis measuring method for a radiation light source which recognizes the angle of the optical axis of an LD from an image, and recognizes in advance the position of the optical axis occupied on rectangular coordinates, when looked from a reference plane of an optical semiconductor package being a supporting structure for the LD, without operating a complicated driving mechanism. SOLUTION: A screen 8 as a diffusing panel is arranged between the LD 1 and a CCD camera 7, and an image of light transmitted through the screen 8 is picked up by a two-dimensional camera, and the image is input to an image processing apparatus. The position of the maximum luminance of the image pattern is determined as the optical axis B of the LD 1, and is stored as the position of the optical axis occupied in the rectangular coordinates on the reference plane in the optical semiconductor package as a supporting structure for the LD 1. COPYRIGHT: (C)2004,JPO
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