发明名称 |
Apparatus for measuring position of fine particle |
摘要 |
A device for measuring the three-dimensional position of a single particle (208) in a solution comprises a pulsed laser (201); a microscope system for irradiating a single particle with a laser beam (203) emitted from a pulsed laser (201); a photodetector (209) for detecting light dispersed by the single particle; a computer (211) for recording the signal detected by the photodetector (209) as displacement data and processing it; and a high-speed A/D board (210) for introducing the signal detected by photodetector (209) into the computer (211). Timing is set for data input so that the signal detected by the photodetector (209) may be input to the computer (211) at the moment of laser irradiation. It is possible to measure the position of a particle of nanometer size in real time with accuracy of nanometer order.
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申请公布号 |
US2004011946(A1) |
申请公布日期 |
2004.01.22 |
申请号 |
US20020239221 |
申请日期 |
2002.12.13 |
申请人 |
SASAKI KEIJI;HOTTA JUNICHI |
发明人 |
SASAKI KEIJI;HOTTA JUNICHI |
分类号 |
G01B11/00;G01N15/00;G01N15/14;G21K1/00;(IPC1-7):G01N21/85;G01N21/49 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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