发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device of the vertical or horizontal MOSFET structure which can improve the trade-off relations between an ON resistor and a feedback capacitor and has sufficiently higher reliability. <P>SOLUTION: The semiconductor device comprises a semiconductor layer (4) of a first conductivity, a pair of base regions (6) of a second conductivity selectively formed on the surface of the semiconductor layer (4), a source region (8) of the first conductivity selectively formed on the surface of the base regions, an electric field alleviation region (20) of the second conductivity selectively formed between a pair of base regions at the surface of the semiconductor layer, a pair of gate electrodes (12) respectively provided via a gate insulation film (10) at the surface of the base regions between respective source regions and the electric field alleviation region, and a source electrode (14) connected to the source region. The electric field alleviation region is insulated for the gate electrode and source electrode via an insulation film. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004022693(A) 申请公布日期 2004.01.22
申请号 JP20020173649 申请日期 2002.06.14
申请人 TOSHIBA CORP 发明人 NAKAMURA KAZUTOSHI;YAMAGUCHI YOSHIHIRO;KAWAGUCHI YUSUKE;ONO SHOTARO;NAKAGAWA AKIO
分类号 H01L21/285;H01L29/06;H01L29/08;H01L29/423;H01L29/78 主分类号 H01L21/285
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