| 摘要 |
A contactor assembly useable on a component testing system for electrically contacting a terminal on a device under test (DUT) for parametric testing and eventual sorting as part of component batch processing includes a holder subassembly and a tip subassembly. The holder subassembly includes a housing and spring-biasing components within the housing. The housing has a proximal end portion for mounting on the component testing system and a distal end portion for holding the tip subassembly proximate the terminal of the device under test. The tip subassembly includes a blade-holding structure and at least one blade held by the blade-holding structure, and the contactor assembly includes components (i.e., a quick-release mechanism) for removably mounting the tip subassembly on the distal end portion of the housing with the spring-biasing components spring biasing the blade toward the terminal of the device under test. According to a separate aspect of the invention, the contactor assembly includes a passageway-defining structure that defines a passageway extending within the contactor assembly through which to perform a desired operation (e.g., vision operations, laser operations, light operations, air or gas flow operations, liquid operations, coaxial cable operations) on the device under test such as, for example, using an optical fiber in the passageway as part of a fiber optic positioning system.
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