| 发明名称 |
Line width check in layout database |
| 摘要 |
A method for checking the accuracy of non-standard line widths in a layout includes marking lines with a line width marker, and associating the line width markers with the lines throughout a design process to ensure that the lines remain at the desired widths.
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| 申请公布号 |
US2004015797(A1) |
申请公布日期 |
2004.01.22 |
| 申请号 |
US20020199727 |
申请日期 |
2002.07.19 |
| 申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
CHEVALLIER CHRISTOPHE;ABABEI ADRIANA |
| 分类号 |
G06F17/50;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
| 代理机构 |
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