发明名称 Layout design process and system for providing bypass capacitance and compliant density in an integrated circuit
摘要 An IC layout design process and system involves placing an adjustable capacitor cell having a plurality of sub-cells, each with a polysilicon shape disposed over a corresponding active area shape. The polysilicon shapes are electrically coupled to a first power rail and the active area shapes are electrically coupled to a second power rail. The sub-cells of the adjustable capacitor cell are operable to be modified to satisfy a density measurement associated with the IC's fabrication flow.
申请公布号 US2004015802(A1) 申请公布日期 2004.01.22
申请号 US20020197346 申请日期 2002.07.17
申请人 CLOUDMAN JOHN ANDREW FRANCIS;LACHMAN JONATHAN;MICHELL NICHOLAS 发明人 CLOUDMAN JOHN ANDREW FRANCIS;LACHMAN JONATHAN;MICHELL NICHOLAS
分类号 G06F9/45;G06F17/50;H01L21/822;H01L27/02;H01L27/08;(IPC1-7):G06F9/45 主分类号 G06F9/45
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