| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of shortening the patterns for RAM (Random Access Memory) continuous access, and of reducing the test time. SOLUTION: An n-multiplied clock signal formed by multiplying an external input clock signal by an n (n is a real number) in a chip is used for the clock signal for synchronizing the operation of a RAM section. The defect of a memory cell is detected only by having the access operation within the RAM executed at high speed, thereafter by collating an expected value once in the last of one cycle of an external clock. Namely, the expected value is not collated at every clock cycle, but the high speed clock is inputted only to either one of an X side or Y side and the continuous access operation is performed, then the check as to the presence of a change in the data of the RAM cell by the influence of the continuous access or not is carried out with the single pattern. COPYRIGHT: (C)2004,JPO
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