发明名称 TREATMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a treatment device which cleans the upper part of a protective means located under a substrate as an object of treatment surely so as to prevent stains from being attached to the substrate in the treatment device comprising a process of cleaning the rear surface of the substrate as a cleaning solution is supplied on it. SOLUTION: The semiconductor wafer substrate 101 is held on a vacuum chuck 102 in a freely rotatable manner, and an annular member 105 is formed below the semiconductor wafer substrate 101 so as to surround the periphery of the vacuum chuck 102. A rear surface cleaning nozzle 106 for supplying a cleaning solution on the rear surface of the substrate 101 is arranged inside the annular member 105. A rear surface cleaning peripheral nozzle 107 for supplying a cleaning solution onto the upper part of the annular member 105 is arranged outside of the rear surface cleaning nozzle 106 in a radial direction and close to the annular member 105. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004022783(A) 申请公布日期 2004.01.22
申请号 JP20020175367 申请日期 2002.06.17
申请人 SHARP CORP 发明人 ISHIMARU MASAAKI
分类号 G03F7/30;B05C11/08;B08B3/02;H01L21/027;H01L21/304;(IPC1-7):H01L21/027 主分类号 G03F7/30
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